مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3827905

Title :

Author´s reply

Author :

R.G. Bennetts

Author_Institution :

Department of Electronics//University of Southhampton//Southampton, Hampshire S09 5NH, ENGLAND

Issue :

fYear :

1976

Keywords :

"Fault trees","Combinational circuits","Turning","Frequency","Computer networks","Algorithm design and analysis","Automatic testing","Instruments","Circuit testing","Integrated circuit testing"

Journal_Title :

IEEE Transactions on Reliability

Publisher :

ieee

ISSN :

0018-9529

Type :

jour

DOI :

10.1109/TR.1976.5215007

Filename :

5215007

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3827905