DocumentCode
3828094
Title
Preface
Author
Gary L. Crellin
Author_Institution
Applied Mathematics Laboratory, General Electric Co., Louisville, Ky.
Issue
3
fYear
1972
Firstpage
127
Lastpage
128
Keywords
"Bayesian methods","Reliability theory","Decision theory","Parametric statistics","Educational institutions","Testing","Estimation theory","Standardization","Poisson equations","Hazards"
Journal_Title
IEEE Transactions on Reliability
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1972.5215972
Filename
5215972
Link To Document