• DocumentCode
    3828179
  • Title

    The Reliability Discipline

  • Issue
    3
  • fYear
    1970
  • Firstpage
    81
  • Lastpage
    81
  • Keywords
    "Uncertainty","Hardware","Knowledge management","Semiconductor device reliability","Statistical analysis","Land transportation","Failure analysis","Art","Electron devices"
  • Journal_Title
    IEEE Transactions on Reliability
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1970.5216409
  • Filename
    5216409
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3828179