مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3828179

Title :

The Reliability Discipline

Issue :

fYear :

1970

Firstpage :

Lastpage :

Keywords :

"Uncertainty","Hardware","Knowledge management","Semiconductor device reliability","Statistical analysis","Land transportation","Failure analysis","Art","Electron devices"

Journal_Title :

IEEE Transactions on Reliability

Publisher :

ieee

ISSN :

0018-9529

Type :

jour

DOI :

10.1109/TR.1970.5216409

Filename :

5216409

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3828179