DocumentCode :
3828277
Title :
Correction to "Relation of a Physical Process to the Reliability of Electronic Components"
Author :
Clarence F. Kooi
Issue :
3
fYear :
1968
Keywords :
"Electronic components","Potential well","Equations","Impurities"
Journal_Title :
IEEE Transactions on Reliability
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1968.5216934
Filename :
5216934
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3828277
