مرکز منطقه ای اطلاع رساني علوم و فناوري - Correction to "Physical Basis for Evaluating the Reliability of p-n Junction Devices´"

DocumentCode :

3828281

Title :

Correction to "Physical Basis for Evaluating the Reliability of p-n Junction Devices´"

Author :

Jack S. Smith;Joseph Vaccaro

Issue :

fYear :

1968

Firstpage :

201

Lastpage :

201

Keywords :

"P-n junctions","Voltage","Materials reliability","Electrons","Charge carrier lifetime","Equations","Dielectric constant"

Journal_Title :

IEEE Transactions on Reliability

Publisher :

ieee

ISSN :

0018-9529

Type :

jour

DOI :

10.1109/TR.1968.5216947

Filename :

5216947

Link To Document :