• DocumentCode
    3828281
  • Title

    Correction to "Physical Basis for Evaluating the Reliability of p-n Junction Devices´"

  • Author

    Jack S. Smith;Joseph Vaccaro

  • Issue
    4
  • fYear
    1968
  • Firstpage
    201
  • Lastpage
    201
  • Keywords
    "P-n junctions","Voltage","Materials reliability","Electrons","Charge carrier lifetime","Equations","Dielectric constant"
  • Journal_Title
    IEEE Transactions on Reliability
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1968.5216947
  • Filename
    5216947
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3828281