DocumentCode :
3828808
Title :
Reply by Authors to Singh & Kankam
Author :
S.K. Banerjee;K. Rajamani
Author_Institution :
Department of Electrical Engineering//Indian Institute of Technology//Bombay, Powai 400 076 INDIA.
Issue :
5
fYear :
1976
Firstpage :
339
Lastpage :
339
Keywords :
Reliability
Journal_Title :
IEEE Transactions on Reliability
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1976.5220035
Filename :
5220035
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3828808
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