مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3829317

Title :

Quality in Electronics

Issue :

fYear :

1983

Firstpage :

213

Lastpage :

213

Keywords :

"USA Councils","Quality management","Microelectronics","Testing","Conference management","Databases","Production systems","Research and development","Semiconductor device reliability","Power system reliability"

Journal_Title :

IEEE Transactions on Reliability

Publisher :

ieee

ISSN :

0018-9529

Type :

jour

DOI :

10.1109/TR.1983.5221537

Filename :

5221537

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3829317