• DocumentCode
    3829317
  • Title

    Quality in Electronics

  • Issue
    2
  • fYear
    1983
  • Firstpage
    213
  • Lastpage
    213
  • Keywords
    "USA Councils","Quality management","Microelectronics","Testing","Conference management","Databases","Production systems","Research and development","Semiconductor device reliability","Power system reliability"
  • Journal_Title
    IEEE Transactions on Reliability
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1983.5221537
  • Filename
    5221537
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3829317