• DocumentCode
    383098
  • Title

    New high-power BIMOS-devices based on silicon-silicon bonding

  • Author

    Detjen, Dirk ; Schröder, Stefan ; De Doncker, Rik W.

  • Author_Institution
    Inst. for Power Electron. & Electr. Drives, Aachen Univ. of Technol., Germany
  • Volume
    3
  • fYear
    2002
  • fDate
    13-18 Oct. 2002
  • Firstpage
    2152
  • Abstract
    This paper investigates the feasibility of using silicon-silicon bonding technology for combined bipolar-MOSFET-devices (BIMOS) such as MOS-turn-off thyristors (MTO). With the help of this new bonding technique several power MOSFETs are connected to a bipolar disc-type device structure. The MOSFET dies are used to switch the BIMOS-device. At the same time, the reverse conducting diode of the MOSFETs operates as a pn-junction of the classical thyristor structure during on-state. The proposed technology accomplishes the fabrication of BIMOS-devices without bonding wires, which are used in state-of-the-art MTO and ETO devices. Device operation similar to a fully integrated structure can be achieved without the technological problems in manufacturing VLSI-structures on large disc-type devices. In this paper, different MTO type device topologies based on the proposed idea are presented and compared by finite element simulation results.
  • Keywords
    BIMOS integrated circuits; MOS-controlled thyristors; VLSI; power MOSFET; power semiconductor devices; silicon; wafer bonding; BIMOS; MOS-turn-off thyristors; MOSFET dies; VLSI-structures; bipolar disc-type device structure; combined bipolar-MOSFET-devices; finite element simulation; high-power BIMOS-devices; pn-junction; reverse conducting diode; silicon-silicon bonding; thyristor structure; Bonding; Diodes; Fabrication; Finite element methods; MOSFETs; Manufacturing; Switches; Thyristors; Topology; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2002. 37th IAS Annual Meeting. Conference Record of the
  • Conference_Location
    Pittsburgh, PA, USA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-7420-7
  • Type

    conf

  • DOI
    10.1109/IAS.2002.1043829
  • Filename
    1043829