Title :
EMI power analysis of transient fields from fixed gap ESD
Author :
Honda, Masamitsu
Author_Institution :
Impulse Phys. Lab. Inc., Yokohama, Japan
Abstract :
Radiated transient fields from fixed gap ESD is experimentally analyzed. The magnitude of di/dt of discharge current is decreased with charge voltage increase. The probability of digital IC´s upset (EMI: electromagnetic interference) is not proportional to charge voltage under fixed gap ESD. A model of impulsive EMI power is proposed.
Keywords :
digital integrated circuits; electric charge; electromagnetic interference; electrostatic discharge; EMI power analysis; charge voltage; digital IC upset; discharge current; electromagnetic interference; fixed gap ESD; impulsive EMI; transient fields; Digital integrated circuits; Electromagnetic fields; Electromagnetic interference; Electromagnetic transients; Electrostatic discharge; Electrostatic interference; Receiving antennas; Rubber; Transient analysis; Voltage;
Conference_Titel :
Industry Applications Conference, 2002. 37th IAS Annual Meeting. Conference Record of the
Conference_Location :
Pittsburgh, PA, USA
Print_ISBN :
0-7803-7420-7
DOI :
10.1109/IAS.2002.1044101
