DocumentCode :
3833038
Title :
Effect of internal thermal feedback on transistor quiescent stability
Author :
P. Mars
Author_Institution :
Liverpool Regional College of Technology, Department of Electrical Engineering, Liverpool, UK
Volume :
114
Issue :
8
fYear :
1967
fDate :
8/1/1967 12:00:00 AM
Firstpage :
1075
Lastpage :
1076
Journal_Title :
Proceedings of the Institution of Electrical Engineers
Publisher :
iet
ISSN :
0020-3270
Type :
jour
DOI :
10.1049/piee.1967.0205
Filename :
5249983
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3833038