مرکز منطقه ای اطلاع رساني علوم و فناوري - Effect of internal thermal feedback on transistor quiescent stability

DocumentCode :

3833038

Title :

Effect of internal thermal feedback on transistor quiescent stability

Author :

P. Mars

Author_Institution :

Liverpool Regional College of Technology, Department of Electrical Engineering, Liverpool, UK

Volume :

114

Issue :

fYear :

1967

fDate :

8/1/1967 12:00:00 AM

Firstpage :

1075

Lastpage :

1076

Journal_Title :

Proceedings of the Institution of Electrical Engineers

Publisher :

iet

ISSN :

0020-3270

Type :

jour

DOI :

10.1049/piee.1967.0205

Filename :

5249983

Link To Document :