DocumentCode :
383316
Title :
Artificial intelligence based measurement system supervision
Author :
Durakbasa, M.N.
Author_Institution :
Dept. for Interchangeable Manuf. & Ind. Metrol., Vienna Univ. of Technol., Wien, Austria
Volume :
1
fYear :
2002
fDate :
2002
Firstpage :
298
Abstract :
The permanent increasing of quality standards, world wide competition, as well as the legislation of regulation of the product responsibility, require not only a proper documentation of the measurement data of the production, but also the continuous supervision of measuring and test equipment. Especially in modern flexible and intelligent production environment, measuring devices are often connected directly with the manufacturing process. This causes direct or indirect influences on the quality level, therefore the supervision and management of measuring and test equipment is becoming a significant part of the quality management for the entire production. The supervision of measuring equipment is an essential quality requirement for modern production especially at the higher demands of micro and nano technology. The efficiency of the confirmation can be increased and expenses can be reduced substantially through computer assistance with flexible checking intervals. A special method developed for this purpose allows to increase of the flexibility level and efficiency of a system for the intelligent management and supervision of measuring devices.
Keywords :
artificial intelligence; computerised instrumentation; fuzzy logic; artificial intelligence based measurement system supervision; documentation; flexible checking intervals; flexible production environment; fuzzy logic dynamification; intelligent management; intelligent production environment; intelligent supervision; micro technology; nano technology; product responsibility; quality standards; Artificial intelligence; Documentation; Fuzzy logic; Intelligent systems; Measurement standards; Monitoring; Production systems; Quality management; Test equipment; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Systems, 2002. Proceedings. 2002 First International IEEE Symposium
Print_ISBN :
0-7803-7134-8
Type :
conf
DOI :
10.1109/IS.2002.1044271
Filename :
1044271
Link To Document :
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