مرکز منطقه ای اطلاع رساني علوم و فناوري - Erratum: Use of tests at elevated temperatures to accelerate the life of an m.o.s. integrated circuit

DocumentCode :

3833246

Title :

Erratum: Use of tests at elevated temperatures to accelerate the life of an m.o.s. integrated circuit

Author :

F.H. Reynolds;R.W. Parrott;D. Braithwaite

Volume :

119

Issue :

fYear :

1972

fDate :

12/1/1972 12:00:00 AM

Firstpage :

1686

Journal_Title :

Proceedings of the Institution of Electrical Engineers

Publisher :

iet

ISSN :

0020-3270

Type :

jour

DOI :

10.1049/piee.1972.0336

Filename :

5251265

Link To Document :