DocumentCode
3833246
Title
Erratum: Use of tests at elevated temperatures to accelerate the life of an m.o.s. integrated circuit
Author
F.H. Reynolds;R.W. Parrott;D. Braithwaite
Volume
119
Issue
12
fYear
1972
fDate
12/1/1972 12:00:00 AM
Firstpage
1686
Journal_Title
Proceedings of the Institution of Electrical Engineers
Publisher
iet
ISSN
0020-3270
Type
jour
DOI
10.1049/piee.1972.0336
Filename
5251265
Link To Document