Title :
Application-specific low-voltage current amplifier for system-on-chip IDDQ test
Author :
Dragic, Srdjan ; Margala, Martin
Author_Institution :
Electr. & Comput. Eng. Res. Facility, Alberta Univ., Edmonton, Alta., Canada
Abstract :
A novel topology of a low-voltage, low-power application-specific amplifier design is presented in this paper. The amplifier is designed as a built-in-self-test (BIST) on-chip circuitry for power supply current monitoring, and could be implemented with analog, digital or mixed-signal cores in system-on-chip (SOC) applications. The architecture is suitable for high frequency IDDQ test. A 1.2 V high-frequency current amplifier is developed as a central part of the BIST structure. With sensitivity of less than 200 nA, the amplifier achieves a gain-bandwidth product of 7 GHz, a low frequency current gain of 48 dB, high linearity for an input current range of ±15 μA and power consumption of 5.2 mW. The current amplifier has been implemented in 0.13 μm CMOS technology with a 1.2 V power supply.
Keywords :
CMOS integrated circuits; amplifiers; built-in self test; circuit CAD; circuit simulation; electric current measurement; integrated circuit design; integrated circuit modelling; integrated circuit noise; integrated circuit testing; low-power electronics; system-on-chip; -15 to 15 muA; 0.13 micron; 1.2 V; 200 nA; 48 dB; 5.2 mW; BIST; CMOS application-specific LV current amplifiers; SOC high-frequency IDDQ test applications; amplifier sensitivity/gain-bandwidth product; analog/digital/mixed-signal system-on-chip cores; built-in-self-test on-chip circuitry; high-frequency current amplifiers; input current range linearity; low frequency current gain; low-voltage low-power amplifier design; noise analysis; power consumption; power supply current monitoring; power supply voltage; Built-in self-test; CMOS technology; Circuit testing; Circuit topology; Current supplies; Frequency; Monitoring; Power amplifiers; Power supplies; System-on-a-chip;
Conference_Titel :
Electronics, Circuits and Systems, 2002. 9th International Conference on
Print_ISBN :
0-7803-7596-3
DOI :
10.1109/ICECS.2002.1045417
