DocumentCode :
383740
Title :
A B-s complement continuous valued digit adder
Author :
Aroca, Ricardo Andres ; Ahmadi, M. ; Hashemian, Reza ; Jullien, G.A. ; Miller, W.C.
Author_Institution :
VLSI Res. Group, Windsor Univ., Ont., Canada
Volume :
2
fYear :
2002
fDate :
2002
Firstpage :
433
Abstract :
This paper presents the first VLSI implementation of test circuitry for the continuous valued digits number system (CVNS). The CVNS is a recently introduced number system that uses a set of analog digits; the lower-order digits being used only to correct inaccuracies in the higher order digits. In order to provide a vehicle for the test implementation, an 8 bit, radix 2, B-s complement CVNS adder is designed using current mode analog circuitry. This initial test circuit is purposely designed with very conservative performance parameters, solely with the aim of demonstrating the viability of the representation and associated arithmetic circuitry. The test structures includes an 8 bit D/A, a modulo operation circuit, and an analog correction circuit. These blocks are combined with two new circuits to realize a novel design approach to CVNS addition that guarantees more than sufficient precision in the generation of the least significant continuous valued digit (CVD), and high tolerance to implementation error.
Keywords :
VLSI; adders; analogue processing circuits; circuit simulation; current-mode circuits; digital arithmetic; digital-analogue conversion; hybrid computers; integrated circuit design; integrated circuit modelling; integrated circuit testing; logic design; logic testing; 8 bit; B-s complement continuous valued digit adders; CVD; CVNS addition precision; CVNS arithmetic; D/A; VLSI; analog correction circuits; analog digits; continuous valued digits number system; current mode analog circuitry; higher/lower-order digits; implementation error tolerance; least significant continuous valued digit; modulo operation circuits; Adders; Arithmetic; Circuit testing; Digital systems; Digital-analog conversion; Diodes; Laboratories; System testing; Vehicles; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 2002. 9th International Conference on
Print_ISBN :
0-7803-7596-3
Type :
conf
DOI :
10.1109/ICECS.2002.1046187
Filename :
1046187
Link To Document :
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