Title :
Fast static compaction of tests composed of independent sequences: basic properties and comparison of methods
Author :
Raik, Jaan ; Jutman, Artur ; Ubar, Raimund
Author_Institution :
Tallinn Tech. Univ., Estonia
Abstract :
This paper presents an overview of recently proposed fast methods for static compaction of sequential circuit tests divided into independent test sequences. The methods include genetic algorithm based, greedy and deterministic approaches. We explain the algorithms and discuss the underlying complexity issues. The different methods were tested on a large number of publicly available benchmark test sets in order to assess their efficiency. In addition to the comparison of approaches, our experiments reveal some remarkable properties of realistic sequential circuit test sets.
Keywords :
circuit complexity; circuit optimisation; deterministic algorithms; genetic algorithms; logic testing; sequential circuits; algorithm complexity; deterministic approach; fast static compaction; genetic algorithm based approach; greedy approach; independent test sequences; publicly available benchmark test sets; realistic sequential circuit test set properties; sequential circuit tests; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Compaction; Fault detection; Genetic algorithms; Performance evaluation; Sequential analysis; Sequential circuits;
Conference_Titel :
Electronics, Circuits and Systems, 2002. 9th International Conference on
Print_ISBN :
0-7803-7596-3
DOI :
10.1109/ICECS.2002.1046190
