Non-robust delay test pattern enhancement

Test pattern generation for delay fault models can be based on the robust or the non-robust test criterion. Since most faults cannot be tested in a robust manner, our focus is on non-robust test pattern generation. We show how test pattern generation based on the non-robust test criterion can be performed. Furthermore, the amount of robust tests in a test set derived from the non-robust sensitization criteria is evaluated. It turns out that this fraction can increase if additional constraints (which can easily be implemented) are applied. Finally, the influence of compact test patterns on the test quality and the test set size is considered.