Title :
An evolutionary algorithm for the testable allocation problem in high-level synthesis
Author :
Harmanani, Haidar ; Saliba, Rony
Author_Institution :
Dept. of Comput. Sci., Lebanese American Univ., Byblos, Lebanon
Abstract :
A high level synthesis for testability method is presented with the objective to generate testable RTL designs from behavioral descriptions. The approach is formulated as an allocation problem and solved using an efficient genetic algorithm. We follow the allocation method with an automatic test point selection algorithm. The method has been implemented and design comparisons are reported.
Keywords :
automatic test pattern generation; circuit CAD; circuit optimisation; design for testability; genetic algorithms; high level synthesis; integrated circuit design; integrated circuit testing; logic testing; automatic test point selection algorithm; behavioral descriptions; design comparisons; evolutionary algorithm; genetic algorithm; high level synthesis for testability; testable RTL designs; testable allocation problem; Automatic testing; Biological cells; Built-in self-test; Circuit testing; Evolutionary computation; Genetic algorithms; High level synthesis; Kernel; Logic testing; Registers;
Conference_Titel :
Electronics, Circuits and Systems, 2002. 9th International Conference on
Print_ISBN :
0-7803-7596-3
DOI :
10.1109/ICECS.2002.1046199
