Title :
Efficient post-layout timing verification via RLC trees and explicit PWL timing integration
Author :
Dabrowski, Jerzy J.
Author_Institution :
Dept. of Electr. Eng., Linkoping Univ., Sweden
Abstract :
An approach to sub-micron VLSI timing verification is presented. VLSI signal paths are split into typical stages, each composed of a driver, interconnect circuitry and loading. The timing model for the interconnections is based on an RLC tree, and the CMOS drivers are represented by piecewise constant (PWC) transistor models, which suit well the fast timing analysis technique used, i.e. explicit piecewise linear (PWL) integration. In addition, coupling capacitances to the neighboring lines can be incorporated into the RLC tree. The equivalent second order approximations for the RLC tree are derived by moment matching. Those models reduce significantly the order of the problem, and provide thereby substantial CPU-time savings when simulated. They are also shown to be accurate enough to model the timing behavior of a stage. Practical examples included in the paper verify the presented approach.
Keywords :
CMOS digital integrated circuits; RLC circuits; SPICE; VLSI; circuit CAD; circuit simulation; driver circuits; equivalent circuits; integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; logic CAD; logic simulation; method of moments; piecewise linear techniques; timing; CMOS driver circuits; PWC; PWL integration; RLC tree equivalent second order approximations; RLC trees; SPICE; VLSI post-layout timing verification; VLSI signal path splitting; circuit loading; equivalent circuits; explicit piecewise linear integration; fast timing analysis techniques; interconnect circuitry; interconnection timing models; models order reduction; moment matching; neighboring line coupling capacitances; piecewise constant transistor models; stage timing behavior; Capacitance; Coupling circuits; Driver circuits; Integrated circuit interconnections; Load modeling; Piecewise linear techniques; RLC circuits; Semiconductor device modeling; Timing; Very large scale integration;
Conference_Titel :
Electronics, Circuits and Systems, 2002. 9th International Conference on
Print_ISBN :
0-7803-7596-3
DOI :
10.1109/ICECS.2002.1046262