DocumentCode :
384124
Title :
Signal definition and test description - an IEEE standard
Author :
Ellis, Keith ; Delaney, Dick
fYear :
2002
fDate :
2002
Firstpage :
380
Lastpage :
393
Abstract :
This paper presents a summary of the new Signal Definition and Test Description Standard (SDTD) to be published by the IEEE. SDTD represents a radical departure from previous approaches to test description, in that it no longer simply represents a test language, as typified by ATLAS standards such as IEEE Std. 716 1995. Instead it provides a framework for component libraries of signal descriptions, which can be readily deployed in today´s Automatic Test Systems (ATS) with other standards such as the IVI Signal Interface from the IVI foundation. The other major benefit of this Standard is the ease with which users can extend the signal types to describe emerging technologies and their associated signal requirements.
Keywords :
IEEE standards; automatic test software; measurement standards; signals; ATLAS; IEEE standard; SDTD standard; Signal Definition and Test Description Standard; automatic test systems; component libraries; signal descriptions; signal modeling language; test language; test signal frameworks; Automatic testing; Capacitance measurement; Libraries; Mathematical model; Modems; Object oriented modeling; Specification languages; Standards development; Standards publication; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON Proceedings, 2002. IEEE
ISSN :
1080-7725
Print_ISBN :
0-7803-7441-X
Type :
conf
DOI :
10.1109/AUTEST.2002.1047907
Filename :
1047907
Link To Document :
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