• DocumentCode
    384269
  • Title

    Analysis of error-reject trade-off in linearly combined classifiers

  • Author

    Roli, Fabio ; Fumera, Giorgio ; Vernazza, Gianni

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Cagliari, Italy
  • Volume
    2
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    120
  • Abstract
    In this paper, a framework for the analysis of the error-reject trade-off in linearly combined classifiers is proposed. We start from a framework developed by Tumer and Ghosh (1996, 1999). We extend this framework and analyse some hypotheses under which the linear combination of classifier outputs can improve the error-reject trade-off of the individual classifiers. Experiments that support some of the analytical results are reported.
  • Keywords
    error statistics; pattern classification; probability; biased correlated errors; classification accuracy; error-reject trade-off analysis; linear combination of classifier outputs; linearly combined classifiers; posterior probabilities; reject threshold; unbiased correlated errors; unbiased uncorrelated errors; Argon; Costs; Equations; Error analysis; Error probability; Estimation error; Optical wavelength conversion; Pattern analysis; Reliability theory; Risk analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2002. Proceedings. 16th International Conference on
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-1695-X
  • Type

    conf

  • DOI
    10.1109/ICPR.2002.1048252
  • Filename
    1048252