DocumentCode :
384539
Title :
Conduction and trapping mechanisms in monocrystalline titanium dioxide through the mirror method
Author :
Temga, T. ; Guerret-Piécourt, C. ; Juvé, D. ; Treheux, D.
Author_Institution :
Lab. d´´Ingenierie et Fonctionnalisation des Surfaces, Ecole Centrale de Lyon, Ecully, France
fYear :
2002
fDate :
2002
Firstpage :
656
Lastpage :
659
Abstract :
The present work deals with the use of the Scanning Electron Microscope Mirror method (SEMM method) for characterizing the conduction and trapping mechanisms in the monocrystalline rutile (TiO2). First, the SEMM characterizations shows that monocrystalline rutile traps strong quantity of electric charges, depending on the preliminary thermal and mechanical treatments, like for sapphire. However, one of the most interesting results is the unusual shape of the mirror image. Indeed, instead of being circular the mirrors images are elliptic, leading to the idea that the anisotropy of the material could play an important role on the conduction and trapping mechanisms. This idea is confirmed by the evolution of the curved part of the typical mirror plot 1/d=f(V). This curved part, interpreted for example in a model of multipole approximation, clearly shows an anisotropic shape of the distribution geometry of the charges. Finally, correlations with the presence of dislocations, as preferential way of electron conduction and (or) traps will be made to explain this anisotropic shape.
Keywords :
electrical conductivity; scanning electron microscopy; space charge; titanium compounds; wide band gap semiconductors; TiO2; anisotropy; charge trapping; dislocation defect; electrical conduction; mechanical treatment; monocrystalline rutile; multipole model; scanning electron microscope mirror method; thermal treatment; Anisotropic magnetoresistance; Annealing; Conducting materials; Crystalline materials; Dielectrics and electrical insulation; Electron traps; Mirrors; Scanning electron microscopy; Shape; Titanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2002 Annual Report Conference on
Print_ISBN :
0-7803-7502-5
Type :
conf
DOI :
10.1109/CEIDP.2002.1048881
Filename :
1048881
Link To Document :
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