Title :
Engineering index: the quantification of uncertain margins and reliabilities with sparse data
Author :
Reardon, Brian J. ; Booker, Jane M. ; Dolin, Ronald M. ; Faust, Cheryll L. ; Hamada, Michael S.
Author_Institution :
Los Alamos Nat. Lab., NM, USA
Abstract :
The Engineering Index (EI) provides a measure of goodness for engineered systems, subsystems, components, and product functions. The EI supports certification and planning endeavors by assessing both a product´s current state as well as inferring how a system potentially changes over time relative to their requirements. This work will show how Bayes Theorem can be used to accomplish this inference. The inference available through El allows decision makers to plan for, and possibly mitigate, problems ahead of a crisis by estimating how a product´s changes impacts system performance.
Keywords :
Bayes methods; decision theory; design engineering; inference mechanisms; uncertainty handling; Bayes Theorem; Engineering Index; capability index; certification; decision makers; inference; measure of goodness; planning; Aging; Certification; Data engineering; Design engineering; Laboratories; Manufacturing; Reliability engineering; Safety; System performance; Systems engineering and theory;
Conference_Titel :
Automation Congress, 2002 Proceedings of the 5th Biannual World
Print_ISBN :
1-889335-18-5
DOI :
10.1109/WAC.2002.1049535