• DocumentCode
    3846239
  • Title

    A Lab-Scale Alternative Interconnection Solution of Semiconductor Dice Compatible with Power Modules 3-D Integration

  • Author

    Ludovic M?nager;Maher Soueidan;Bruno Allard;Vincent Bley;Beno?t Schlegel

  • Author_Institution
    INRETS, LTN Laboratory, Versailles, France
  • Volume
    25
  • Issue
    7
  • fYear
    2010
  • fDate
    7/1/2010 12:00:00 AM
  • Firstpage
    1667
  • Lastpage
    1670
  • Abstract
    Increase in the power density of power modules requires an interconnection technology alternative to wire-bonding technology. Emerging interconnection technologies allow a 3-D packaging of power modules. A proposal of interconnection solution for the power semiconductor dice is presented here; it is based on copper microposts that are electroplated on topside of the die. The die with its microposts is then attached to a top direct-bonding copper (DBC) substrate using a copper/tin transient liquid phase technique. The assembly of the backside of the die to a bottom DBC substrate is processed concurrently using the same transient liquid phase technique. The benefits or limitations of the substrate on the assembly are not discussed in this letter. Manufacturing and electrical characterization of a power semiconductor die with the microposts interconnection is presented in detail.
  • Keywords
    "Multichip modules","Assembly","Wire","Laboratories","Switches","Packaging","Copper","Substrates","Bonding","Temperature"
  • Journal_Title
    IEEE Transactions on Power Electronics
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2010.2041557
  • Filename
    5406068