• DocumentCode
    3846260
  • Title

    VLSI-TSA and VLSI-DAT to Highlight 3-D IC Technology in 2010 Program [Conference Reports]

  • Author

    Clara Wu;Elodie Ho

  • Volume
    2
  • Issue
    1
  • fYear
    2010
  • Firstpage
    74
  • Lastpage
    75
  • Keywords
    "Three-dimensional integrated circuits","Very large scale integration","Technology management","Design automation","CMOS technology","Automatic testing","Conferences","Communication industry","Moore´s Law","Micromechanical devices"
  • Journal_Title
    IEEE Solid-State Circuits Magazine
  • Publisher
    ieee
  • ISSN
    1943-0582
  • Type

    jour

  • DOI
    10.1109/MSSC.2009.935265
  • Filename
    5406353
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3846260