DocumentCode :
3846260
Title :
VLSI-TSA and VLSI-DAT to Highlight 3-D IC Technology in 2010 Program [Conference Reports]
Author :
Clara Wu;Elodie Ho
Volume :
2
Issue :
1
fYear :
2010
Firstpage :
74
Lastpage :
75
Keywords :
"Three-dimensional integrated circuits","Very large scale integration","Technology management","Design automation","CMOS technology","Automatic testing","Conferences","Communication industry","Moore´s Law","Micromechanical devices"
Journal_Title :
IEEE Solid-State Circuits Magazine
Publisher :
ieee
ISSN :
1943-0582
Type :
jour
DOI :
10.1109/MSSC.2009.935265
Filename :
5406353
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3846260
