• DocumentCode
    3846597
  • Title

    Extensions to Backward Propagation of Variance for Statistical Modeling

  • Author

    Colin C. McAndrew;Xin Li;Ivica Stevanovic;Gennady Gildenblat

  • Author_Institution
    Freescale Semiconductor
  • Volume
    27
  • Issue
    2
  • fYear
    2010
  • Abstract
    Correlating the statistics of process parameters with the statistics of electrical performance is a vital task in statistical modeling. This article describes a more general form of the backward propagation of variance (BPV) method, a numerical technique for iteratively solving the statistics of process parameters from the statistics of electrical performance within the behavior of models encapsulated in Spice.
  • Keywords
    "Solid modeling","Predictive models","SPICE","Statistics","Circuit simulation","Semiconductor device modeling","CMOS technology","Principal component analysis","Analysis of variance","Numerical models"
  • Journal_Title
    IEEE Design & Test of Computers
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2010.44
  • Filename
    5432321
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3846597