DocumentCode :
3846598
Title :
Conference Reports
Author :
Rohit Kapur
Author_Institution :
Synopsys
Volume :
27
Issue :
2
fYear :
2010
Firstpage :
75
Lastpage :
75
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2010.41
Filename :
5432325
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3846598
