• DocumentCode
    384765
  • Title

    Comparative study on power quality disturbance magnitude characterization

  • Author

    Wang, Z.Q. ; Zhu, S.Z.

  • Author_Institution
    Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
  • Volume
    1
  • fYear
    2002
  • fDate
    13-17 Oct 2002
  • Firstpage
    106
  • Abstract
    Power quality disturbances (PQD) are normally monitored by dedicated PQ devices. The devices capture disturbances´ waveform in real-time. Magnitude is accepted as a significant index for detection, general classification and later assessment analysis. To choose a suitable way of magnitude characterization is a fundamental work of PQD measuring and monitoring. This study presents three different ways, RMS voltage, peak voltage and fundamental voltage component, to determine magnitude. The algorithms of the three approaches implemented in Matlab are introduced. The algorithms are FFT-based and wavelet transformation (WT) based. A voltage sag benchmark in a radial test system is used to verify and validate the study. The depth-duration characterization of voltage sags is illustrated. The most appropriate approach is suggested at the end of the paper according to the practical monitoring or measuring requirements. The research result is applied to a new PQ monitor with DSP infrastructure being developed by us. The proper window length selection and technique to avoid oscillation is also discussed in the rest of the paper. The information obtained from the magnitude characterization can be furthered to extract features for PQD detection and classification.
  • Keywords
    fast Fourier transforms; power supply quality; power system analysis computing; signal processing; wavelet transforms; DSP infrastructure; FFT based algorithm; Matlab; RMS voltage; depth-duration characterization; digital signal processing; fundamental voltage; measuring requirements; oscillation avoidance; peak voltage; power quality disturbance magnitude characterization; power quality disturbances monitoring; radial test system; voltage sag benchmark; wavelet transformation based algorithm; window length selection; Digital signal processing; Discrete wavelet transforms; Feature extraction; Monitoring; Power quality; Power system transients; Root mean square; Signal processing algorithms; Voltage fluctuations; Wavelet packets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power System Technology, 2002. Proceedings. PowerCon 2002. International Conference on
  • Print_ISBN
    0-7803-7459-2
  • Type

    conf

  • DOI
    10.1109/ICPST.2002.1053513
  • Filename
    1053513