Title :
Extensive SEU Impact Analysis of a PIC Microprocessor for Selective Hardening
Author :
Mario García Valderas;Marta Portela Garcia;Celia Lopez;Luis Entrena
Author_Institution :
Electronic Technology Department, University Carlos III of Madrid, Leganes, Spain
Abstract :
In order to increase the robustness of a circuit against SEUs, fault injection is commonly used to locate weak areas. autonomous emulation is a very powerful tool to locate these areas by executing huge fault injection campaigns. In this work, fault injection has been extensively applied to a PIC18 microprocessor, while executing three different workloads. A 80 million fault campaign has been performed, and results show that a failure rate lower than 1% can be obtained by hardening a 24% of the circuit flip-flops, for the given applications.
Keywords :
"Microprocessors","Circuit faults","Circuit testing","Radiation hardening","Performance evaluation","Emulation","Costs","Error analysis","Logic testing","Manufacturing"
Journal_Title :
IEEE Transactions on Nuclear Science
DOI :
10.1109/TNS.2009.2039581