Title :
Lattice-parameter determination of quartz by means of the Ω-scan method
Author :
Berger, H. ; Bradaczek, H. ; Hildebrandt, G.
Author_Institution :
Res. Center, EFG Int., Berlin, Germany
Abstract :
The lattice parameters of quartz depend on the crystal quality and influence the accuracy of the X-ray orientation determination of resonators. Therefore, they should be known better than 20 ppm. Using the Ω-scan method, the lattice parameters can be determined together with the orientation, measuring at least two additional reflections. Preliminary measurements on SC-cut quartz blanks were performed with standard deviations of the lattice parameters of ≤6 ppm in a measuring time of about 3 min. The evaluation of the peak position must consider its systematic error. The total error is estimated to be <10 ppm. The measuring procedure can also be applied to IT-cut, FC-cut and AT-cut quartz blanks and, moreover, to any single crystal.
Keywords :
X-ray crystallography; crystal resonators; error correction; lattice constants; measurement errors; quartz; Ω-scan method; 3 min; AT-cut quartz blanks; FC-cut quartz blanks; IT-cut quartz blanks; SC-cut quartz blanks; SiO2; X-ray orientation determination accuracy; crystal orientation; crystal quality; crystal resonators; measuring time; peak position systematic error; quartz lattice-parameter determination; reflections; standard deviations; systematic error correction; Crystalline materials; Crystals; Error correction; Impurities; Lattices; Measurement standards; Optical reflection; Performance evaluation; Position measurement; Time measurement;
Conference_Titel :
Frequency Control Symposium and PDA Exhibition, 2002. IEEE International
Print_ISBN :
0-7803-7082-1
DOI :
10.1109/FREQ.2002.1075919
