• DocumentCode
    384981
  • Title

    Phase noise in heterojunction field effect transistor amplifiers

  • Author

    Barua, S. ; Van Slyke, A.M. ; Ferre-Pika, E.S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wyoming Univ., Laramie, WY, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    710
  • Lastpage
    714
  • Abstract
    We present phase modulation (PM) noise results in linear high electron mobility transistor (HEMT) amplifiers at different bias conditions at carrier frequencies of 1 GHz and 2 GHz. Our measurements show that the noise at a carrier frequency of 1 GHz is higher than at 2 GHz as expected. It was also found that the dependence of PM noise with drain voltage and drain current varied when different transistors were used. The best PM noise obtained for a HEMT amplifier was L(10 Hz) ≈ -132 dBc/Hz at a carrier frequency of 1 GHz and L(10 Hz) ≈ -127 dBc/Hz at a carrier frequency of 2 GHz.
  • Keywords
    HEMT circuits; UHF amplifiers; UHF circuits; circuit noise; phase noise; 1 GHz; 2 GHz; HEMT amplifier; bias conditions; carrier frequencies; drain current; drain voltage; heterojunction field effect transistor amplifiers; linear high electron mobility transistor; phase modulation noise; Chirp modulation; FETs; Frequency measurement; HEMTs; Heterojunctions; MODFETs; Noise measurement; Phase modulation; Phase noise; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and PDA Exhibition, 2002. IEEE International
  • Print_ISBN
    0-7803-7082-1
  • Type

    conf

  • DOI
    10.1109/FREQ.2002.1075973
  • Filename
    1075973