DocumentCode
384981
Title
Phase noise in heterojunction field effect transistor amplifiers
Author
Barua, S. ; Van Slyke, A.M. ; Ferre-Pika, E.S.
Author_Institution
Dept. of Electr. & Comput. Eng., Wyoming Univ., Laramie, WY, USA
fYear
2002
fDate
2002
Firstpage
710
Lastpage
714
Abstract
We present phase modulation (PM) noise results in linear high electron mobility transistor (HEMT) amplifiers at different bias conditions at carrier frequencies of 1 GHz and 2 GHz. Our measurements show that the noise at a carrier frequency of 1 GHz is higher than at 2 GHz as expected. It was also found that the dependence of PM noise with drain voltage and drain current varied when different transistors were used. The best PM noise obtained for a HEMT amplifier was L(10 Hz) ≈ -132 dBc/Hz at a carrier frequency of 1 GHz and L(10 Hz) ≈ -127 dBc/Hz at a carrier frequency of 2 GHz.
Keywords
HEMT circuits; UHF amplifiers; UHF circuits; circuit noise; phase noise; 1 GHz; 2 GHz; HEMT amplifier; bias conditions; carrier frequencies; drain current; drain voltage; heterojunction field effect transistor amplifiers; linear high electron mobility transistor; phase modulation noise; Chirp modulation; FETs; Frequency measurement; HEMTs; Heterojunctions; MODFETs; Noise measurement; Phase modulation; Phase noise; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium and PDA Exhibition, 2002. IEEE International
Print_ISBN
0-7803-7082-1
Type
conf
DOI
10.1109/FREQ.2002.1075973
Filename
1075973
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