DocumentCode :
3849943
Title :
Fast Protector Against EMP Using Thin Epitaxial and Polycrystalline Manganite Films
Author :
S. Balevicius;N. Zurauskiene;V. Stankevic;S. Kersulis;A. Abrutis;V. plausinaitiene;L. L. Altgilbers
Author_Institution :
Center for Physical Sciences and Technology, Semiconductor Physics Institute, Vilnius, Lithuania
Volume :
32
Issue :
4
fYear :
2011
Firstpage :
551
Lastpage :
553
Abstract :
A new fast high-power fault current limiter made from epitaxial and polycrystalline La0.83Sr0.17MnO3 thin films and operating at 80 K has been demonstrated. An epitaxial film that exhibits a current-induced increase in its resistance is connected in series with a 50--impedance transmission line, while a polycrystalline film whose resistance decreases with an increase in current is connected in parallel. It has been demonstrated that, when the fault current pulse has an amplitude of 200 V, a rise time of 0.5 ns, and a pulselength of 18 ns, the limitation of its amplitude is 3.5 dB after the rise time and 8 dB at the end of the pulse.
Keywords :
"Epitaxial growth","Resistance","Erbium","Heating","Fault currents","Pulse measurements","Temperature dependence"
Journal_Title :
IEEE Electron Device Letters
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2011.2106195
Filename :
5716665
Link To Document :
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