DocumentCode
3850072
Title
Behavior of platinum/tantalum as interdigital transducers for SAW devices in high-temperature environments
Author
Thierry Aubert;Omar Elmazria;Badreddine Assouar;Laurent Bouvot;Michel Hehn;Sylvain Weber;Mourad Oudich;Damien Gen?ve
Author_Institution
Institut Jean Lamour, France
Volume
58
Issue
3
fYear
2011
Abstract
In this paper, we report on the use of tantalum as adhesion layer for platinum electrodes used in high-temperature SAW devices based on langasite substrates (LGS). Tantalum exhibits a great adhesive strength and a very low mobility through the Pt film, ensuring a device lifetime at 900°C of about one hour in an air atmosphere and at least 20 h under vacuum. The latter is limited by morphological modifications of platinum, starting with the apparition of crystallites on the surface, followed by important terracing and breaking of the film continuity. Secondary neutral mass spectroscopy (SNMS), Auger electron spectroscopy (AES), X-ray diffraction (XRD) measurements, and comparison with iridium-based electrodes allowed us to show that this deterioration is likely intrinsic to platinum film, consisting of agglomeration phenomena. Finally, based on these results, we present a solution that could significantly enhance the lifetime of Pt-based IDTs placed in high-temperature conditions.
Keywords
"Platinum","Films","Annealing","Electrodes","Adhesives","Substrates"
Journal_Title
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/TUFFC.2011.1843
Filename
5733262
Link To Document