• DocumentCode
    3850094
  • Title

    Gate driver for SiC JFETs with protection against normally-on behaviour induced fault

  • Author

    F Guédon;S K Singh;R A McMahon;F Udrea

  • Author_Institution
    Dept. of Eng., Univ. of Cambridge, Cambridge, UK
  • Volume
    47
  • Issue
    6
  • fYear
    2011
  • fDate
    3/17/2011 12:00:00 AM
  • Firstpage
    375
  • Lastpage
    377
  • Abstract
    A fast gate driver for normally-on silicon carbide (SiC) junction field-effect transistors (JFETs) is presented. It includes a protection feature against short-circuits due to the normally-on behaviour of the JFETs.
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2011.0241
  • Filename
    5735441
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3850094