DocumentCode :
3852313
Title :
Organic thin-film transistor bias-dependent capacitance compact model in accumulation regime
Author :
A. Castro-Carranza;M. Estrada;J.C. Nolasco;A. Cerdeira;L.F. Marsal;B. Iniguez;J. Pallares
Author_Institution :
Departament d´Enginyeria Electronica, Electrica i Automatica, Universitat Rovira i Virgili, Av. Pa?sos Catalans 26, Tarragona 43007, Spain
Volume :
6
Issue :
2
fYear :
2012
fDate :
3/1/2012 12:00:00 AM
Firstpage :
130
Lastpage :
135
Abstract :
The authors present an analytical and continuous model for the total charges at the gate, drain and source electrodes for organic thin-film transistors (OTFTs), from which analytical expressions of the total capacitances are obtained. Under the quasi-static approximation, the model parameters are extracted using the previously developed unified model and parameter extraction method (UMEM). The capacitance model is valid above threshold voltage. It guarantees continuity of the expressions for the capacitance at the transition between linear and saturation regimes, as well as takes into account the overlap capacitance. Comparisons between modelled and experimental CGG values are shown.
Journal_Title :
IET Circuits, Devices & Systems
Publisher :
iet
ISSN :
1751-858X
Type :
jour
DOI :
10.1049/iet-cds.2010.0372
Filename :
6177334
Link To Document :
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