• DocumentCode
    3852326
  • Title

    Visible Light and Low-Energy UV Effects on Organic Thin-Film Transistors

  • Author

    Nicola Wrachien;Andrea Cester;Daniele Bari;Ján Jakabovic;Jaroslav Kovac;Daniel Donoval;Gaudenzio Meneghesso

  • Author_Institution
    Department of Information Engineering, University of Padova, Padova , Italy
  • Volume
    59
  • Issue
    5
  • fYear
    2012
  • Firstpage
    1501
  • Lastpage
    1509
  • Abstract
    We evaluated the effects of low-energy ultraviolet (UV) and visible light in organic thin-film-transistors, with an hexamethyldisilazane-treated SiO2 gate dielectric. After visible-light irradiation, the devices showed temporary variation in the threshold voltage, drain current, and transconductance. When UV irradiation is performed, the devices exhibit significant and permanent degradation, with a transconductance drop up to -18%.
  • Keywords
    "Radiation effects","Degradation","Organic thin film transistors","Charge carrier processes","Pentacene","Transconductance"
  • Journal_Title
    IEEE Transactions on Electron Devices
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2187338
  • Filename
    6178792
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3852326