Title :
Visible Light and Low-Energy UV Effects on Organic Thin-Film Transistors
Author :
Nicola Wrachien;Andrea Cester;Daniele Bari;Ján Jakabovic;Jaroslav Kovac;Daniel Donoval;Gaudenzio Meneghesso
Author_Institution :
Department of Information Engineering, University of Padova, Padova , Italy
Abstract :
We evaluated the effects of low-energy ultraviolet (UV) and visible light in organic thin-film-transistors, with an hexamethyldisilazane-treated SiO2 gate dielectric. After visible-light irradiation, the devices showed temporary variation in the threshold voltage, drain current, and transconductance. When UV irradiation is performed, the devices exhibit significant and permanent degradation, with a transconductance drop up to -18%.
Keywords :
"Radiation effects","Degradation","Organic thin film transistors","Charge carrier processes","Pentacene","Transconductance"
Journal_Title :
IEEE Transactions on Electron Devices
DOI :
10.1109/TED.2012.2187338
