• DocumentCode
    3852588
  • Title

    Higher Order Statistics of Sampled Fading Channels With Applications

  • Author

    F. J. López-Martínez;E. Martos-Naya;J. F. Paris;U. Fernández-Plazaola

  • Author_Institution
    Dept. Ing. de Comun., Univ. de Malaga, Malaga, Spain
  • Volume
    61
  • Issue
    7
  • fYear
    2012
  • Firstpage
    3342
  • Lastpage
    3346
  • Abstract
    In this paper, we present a novel analytical framework for the calculation of the level crossing rate (LCR) and the average fade duration (AFD) of fading channels sampled at a certain sampling period TS. These expressions are valid for arbitrary fading distributions with arbitrary correlation and can be easily computed in terms of the cumulative distribution function (cdf) of the fading envelope and its bivariate cdf. This approach yields interesting insights into the effect of finite sampling in the higher order statistics of fading processes. We also demonstrate that the proposed expressions for sampled fading process converge with the existing expressions for continuous fading processes as the sampling period tends to zero. As a direct application, exact closed-form expressions are given for the LCR and AFD of sampled Rayleigh fading processes, which are suitable to characterize the higher order statistics of the equivalent frequency-domain fading process in multipath Rayleigh fading.
  • Keywords
    "Random processes","Rayleigh channels","Higher order statistics","Correlation","OFDM","Frequency domain analysis"
  • Journal_Title
    IEEE Transactions on Vehicular Technology
  • Publisher
    ieee
  • ISSN
    0018-9545
  • Type

    jour

  • DOI
    10.1109/TVT.2012.2199528
  • Filename
    6200887