Title :
Magnetic resonance electrical impedance tomography (MREIT): phantom experiments for static resistivity images using J-substitution algorithm
Author :
Oh, Suk Hoon ; Lee, Byung Il ; Woo, Eung Je ; Lee, Soo Yeol ; Cho, Min Hyoung ; Kwon, Ohin ; Jeong-Rock Yoon ; Seo, Jin Keun
Author_Institution :
Graduate Sch. of East-West Med. Sci., Kyung Hee Univ., Seoul, South Korea
Abstract :
Lately, a new static resistivity image reconstruction algorithm is proposed utilizing internal current density data obtained by the magnetic resonance current density imaging (MRCDI) technique. This new imaging method is called magnetic resonance electrical impedance tomography (MREIT). In this paper, we present experimental procedures, denoising techniques, and image reconstructions using a 0.3 Tesla experimental MREIT system and saline phantoms. MREIT using J-substitution algorithm effectively utilizes the internal current density information resolving the problem inherent in a conventional EIT, that is, the low sensitivity of boundary measurements to any changes of internal tissue resistivity values.
Keywords :
biomedical MRI; electric impedance imaging; image denoising; image reconstruction; medical image processing; phantoms; 0.3 T; J-substitution algorithm; MREIT; boundary measurements; denoising techniques; image reconstructions; internal current density data; internal tissue resistivity values; magnetic resonance current density imaging technique; magnetic resonance electrical impedance tomography; phantom experiments; saline phantoms; static resistivity image reconstruction algorithm; static resistivity images; Conductivity; Current density; Density measurement; Image reconstruction; Imaging phantoms; Impedance; Magnetic resonance; Magnetic resonance imaging; Noise reduction; Tomography;
Conference_Titel :
Engineering in Medicine and Biology, 2002. 24th Annual Conference and the Annual Fall Meeting of the Biomedical Engineering Society EMBS/BMES Conference, 2002. Proceedings of the Second Joint
Print_ISBN :
0-7803-7612-9
DOI :
10.1109/IEMBS.2002.1106204