DocumentCode
3852906
Title
Design and characterisation of ultra-low-power SOI-CMOS IC temperature level detector
Author
M. Assaad;E. Boufouss;P. Gerard;L. Francis;D. Flandre
Author_Institution
Department of Electrical and Electronic Engineering, University of Technology of Petronas, Ipoh, Perak, Malaysia
Volume
48
Issue
14
fYear
2012
fDate
7/5/2012 12:00:00 AM
Firstpage
842
Lastpage
844
Abstract
Described are the design and characterisation of an ultra-low-power temperature level detector (TLD) and temperature sensor based on a silicon-on-insulator (SOI) CMOS integrated circuit (IC) for harsh environment applications. Since this IC is mainly for harsh environment applications (e.g. high temperatures and radiations), it has been designed and manufactured using the 1 μm high-temperature SOI-CMOS technology provided by X-FAB. The measured power dissipation of the TLD circuit is 9 mW at a supply voltage of 5 V and temperature of 27 °C, according to the measurement results of the manufactured design.
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el.2012.1279
Filename
6235155
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