DocumentCode :
3852906
Title :
Design and characterisation of ultra-low-power SOI-CMOS IC temperature level detector
Author :
M. Assaad;E. Boufouss;P. Gerard;L. Francis;D. Flandre
Author_Institution :
Department of Electrical and Electronic Engineering, University of Technology of Petronas, Ipoh, Perak, Malaysia
Volume :
48
Issue :
14
fYear :
2012
fDate :
7/5/2012 12:00:00 AM
Firstpage :
842
Lastpage :
844
Abstract :
Described are the design and characterisation of an ultra-low-power temperature level detector (TLD) and temperature sensor based on a silicon-on-insulator (SOI) CMOS integrated circuit (IC) for harsh environment applications. Since this IC is mainly for harsh environment applications (e.g. high temperatures and radiations), it has been designed and manufactured using the 1 μm high-temperature SOI-CMOS technology provided by X-FAB. The measured power dissipation of the TLD circuit is 9 mW at a supply voltage of 5 V and temperature of 27 °C, according to the measurement results of the manufactured design.
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2012.1279
Filename :
6235155
Link To Document :
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