• DocumentCode
    3852906
  • Title

    Design and characterisation of ultra-low-power SOI-CMOS IC temperature level detector

  • Author

    M. Assaad;E. Boufouss;P. Gerard;L. Francis;D. Flandre

  • Author_Institution
    Department of Electrical and Electronic Engineering, University of Technology of Petronas, Ipoh, Perak, Malaysia
  • Volume
    48
  • Issue
    14
  • fYear
    2012
  • fDate
    7/5/2012 12:00:00 AM
  • Firstpage
    842
  • Lastpage
    844
  • Abstract
    Described are the design and characterisation of an ultra-low-power temperature level detector (TLD) and temperature sensor based on a silicon-on-insulator (SOI) CMOS integrated circuit (IC) for harsh environment applications. Since this IC is mainly for harsh environment applications (e.g. high temperatures and radiations), it has been designed and manufactured using the 1 μm high-temperature SOI-CMOS technology provided by X-FAB. The measured power dissipation of the TLD circuit is 9 mW at a supply voltage of 5 V and temperature of 27 °C, according to the measurement results of the manufactured design.
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2012.1279
  • Filename
    6235155