DocumentCode :
385399
Title :
Progression of left ventricular wall thickness during pressure-overload left ventricular hypertrophy
Author :
Feng, Minjie ; Li, John K J ; Khaw, Kenneth ; Drzewiecki, Gary M.
Author_Institution :
Dept. of Biomed. Eng., Rutgers Univ., Piscataway, NJ, USA
Volume :
2
fYear :
2002
fDate :
2002
Firstpage :
1222
Abstract :
Pressure-overload in terms of decreased arterial compliance (C) and increased vascular resistance (Rs) was used in conjunction with a negative feedback control model to predict left ventricular (LV) wall thickness growth over a prescribed time period. The progression of left ventricular wall thickness growth was found to change proportionally with the peak systolic pressure and the extent of the combination of a reduction in C and an increase in Rs.
Keywords :
cardiology; diseases; elasticity; feedback; haemodynamics; physiological models; arterial compliance; heart disease; left ventricular wall thickness progression; negative feedback control model; peak systolic pressure; pressure-overload left ventricular hypertrophy; vascular resistance; Cardiology; Delay; Ellipsoids; Hemodynamics; Immune system; Myocardium; Negative feedback; Negative feedback loops; Stress; Thickness control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology, 2002. 24th Annual Conference and the Annual Fall Meeting of the Biomedical Engineering Society EMBS/BMES Conference, 2002. Proceedings of the Second Joint
ISSN :
1094-687X
Print_ISBN :
0-7803-7612-9
Type :
conf
DOI :
10.1109/IEMBS.2002.1106358
Filename :
1106358
Link To Document :
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