• DocumentCode
    385598
  • Title

    Experimental study on irreversible electrical breakdown of tumor cell under steep pulsed electric fields

  • Author

    Caixin, Sun ; Chenguo, Yao ; Yan, Mi ; Lan, Xiong ; Ruijin, Liao ; Lina, Hu ; Ya, Hu

  • Author_Institution
    Key Lab of High Voltage Eng. & Electr. New Technol., Minist. of Educ., Chongqing, China
  • Volume
    2
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    1675
  • Abstract
    Describes the dynamic changes of the SKOV3 cancer cell under steep pulsed electric fields (SPEFs, generated by the energy-controllable steep pulse apparatus for tumor treatment) using an inverted phase contrast microscope (IPCM) and finds that the cell was swollen in very short time. The study showed that the membrane of treated cell was destroyed under a scanning electron microscope (SEM), the nucleus was swollen and its karyotheca was not integrated under the transmission electron microscope (TEM). The mitochondria was also cavitated and swollen. It is clear that the SPEFs can result in irreversible electrical breakdown of the tumor cell. It may be a new therapy for tumor treatment.
  • Keywords
    bioelectric phenomena; biological effects of fields; biomembranes; cancer; cellular effects of radiation; optical microscopy; scanning electron microscopy; swelling; transmission electron microscopy; tumours; SEM; SKOV3 cancer cell; TEM; dynamic changes; energy-controllable steep pulse apparatus; inverted phase contrast microscope; irreversible electrical breakdown; karyotheca; membrane; mitochondria; nucleus; scanning electron microscope; steep pulsed electric fields; therapy; transmission electron microscope; tumor cell; tumor treatment; Biomembranes; Cancer; Cells (biology); Drugs; Electric breakdown; Medical treatment; Neoplasms; Scanning electron microscopy; Tumors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology, 2002. 24th Annual Conference and the Annual Fall Meeting of the Biomedical Engineering Society EMBS/BMES Conference, 2002. Proceedings of the Second Joint
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-7612-9
  • Type

    conf

  • DOI
    10.1109/IEMBS.2002.1106597
  • Filename
    1106597