Title :
A Measurement and Calibration Technique for Accurate Measurement of Amplifier S Parameters
Author :
Roos, M. ; Sotoudeh, V.
fDate :
May 9 1975-June 11 1987
Abstract :
With the current emphasis on active systems it is becoming more important to accurately measure amplifiers. Due to the nature of current measurement systems, and the requirements of two port error correction it is difficult to measure a device which cannot be reversed. This paper describes a means for this measurement and calibration.
Keywords :
Bismuth; Calibration; Current measurement; Error correction; Measurement standards; Microwave measurements; Power amplifiers; Power measurement; Reflection; Scattering parameters;
Conference_Titel :
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location :
Palo Alto, CA, USA
DOI :
10.1109/MWSYM.1987.1132429