DocumentCode :
386042
Title :
A Measurement and Calibration Technique for Accurate Measurement of Amplifier S Parameters
Author :
Roos, M. ; Sotoudeh, V.
Volume :
1
fYear :
1987
fDate :
May 9 1975-June 11 1987
Firstpage :
449
Lastpage :
451
Abstract :
With the current emphasis on active systems it is becoming more important to accurately measure amplifiers. Due to the nature of current measurement systems, and the requirements of two port error correction it is difficult to measure a device which cannot be reversed. This paper describes a means for this measurement and calibration.
Keywords :
Bismuth; Calibration; Current measurement; Error correction; Measurement standards; Microwave measurements; Power amplifiers; Power measurement; Reflection; Scattering parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location :
Palo Alto, CA, USA
ISSN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.1987.1132429
Filename :
1132429
Link To Document :
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