Title :
A New Measurement System for Oscillator Noise Characterization
Author :
Riddle, A.N. ; Trew, R.J.
fDate :
May 9 1975-June 11 1987
Abstract :
The prediction of oscillator noise has been one of the more difficult problems in circuit analysis. A new system for measuring modulation (amplitude or phase) transfer and upconversion is presented which allows insight into the causes of oscillator noise. This system can measure modulation at less than -50dbc and accurately predict the oscillator noise spectrum.
Keywords :
Amplitude modulation; Circuit noise; Detectors; Frequency; Measurement techniques; Noise level; Noise measurement; Oscillators; Phase modulation; Phase noise;
Conference_Titel :
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location :
Palo Alto, CA, USA
DOI :
10.1109/MWSYM.1987.1132446
