Title :
A New Automated Noise and Gain Parameter Measurement System
Author :
Hirsch, V.A. ; Miers, T.H.
fDate :
May 9 1975-June 11 1987
Abstract :
This paper describes an automated noise and gain parameter measurement system which operates to 26.5 GHz. A new test set configuration and thorough measurement techniques are employed to minimize errors. The noise and gain parameters for an 0.3 µm gate GaAs FET at 10 and 22 GHz are presented.
Keywords :
Acoustic reflection; Admittance; Colored noise; FETs; Gain measurement; Gallium arsenide; Noise figure; Noise measurement; System testing; Tuners;
Conference_Titel :
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location :
Palo Alto, CA, USA
DOI :
10.1109/MWSYM.1987.1132448
