Title :
Highly-damage-resistant quasi-phase-matched wavelength converter using ZnO-doped LiNbO3
Author :
Tadanaga, Osamu ; Asobe, Masaki ; Miyazawa, Hiroshi ; Nishida, Yoshiki ; Suzuki, Hiroyuki
Author_Institution :
NTT Photonics Labs., NTT Corp., Atsugi, Japan
Abstract :
An all-optical wavelength converter is one of the key devices for realizing future high-speed and flexible wavelength-division multiplexed (WDM) networks. 1.55 μm-band quasi-phase-matched (QPM) wavelength converters based on difference frequency generation (DFG) in periodically poled LiNbO3 (LN) are promising for this application because of their novel features, such as multi-channel conversion, high-efficiency, low noise, and transparency to bit-rate and data format. However, a QPM-LN wavelength converter using congruent LN exhibits photorefractive damage when it is injected with a high-power pump light. One approach to reducing photorefractive damage is to use MgO- or ZnO-doped LN. In this paper, we report a highly-damage-resistant QPM wavelength converter that uses a ZnO-doped LN substrate. The high damage resistance allows high-intensity pumping, which results in high conversion efficiency.
Keywords :
lithium compounds; optical communication equipment; optical noise; optical phase matching; optical pumping; optical wavelength conversion; photorefractive materials; transparency; wavelength division multiplexing; zinc compounds; 1.55 micron; LiNbO3:ZnO; WDM networks; ZnO-doped LiNbO3; difference frequency generation; high conversion efficiency; high-efficiency; high-intensity pumping; high-power pump light; highly-damage-resistant quasi-phase-matched wavelength converter; low noise; multi-channel conversion; periodically poled; photorefractive damage; transparency; wavelength-division multiplexed networks; Annealing; Erbium-doped fiber amplifier; Optical coupling; Photorefractive effect; Power generation; Protons; Temperature; WDM networks; Wavelength conversion; Wavelength division multiplexing;
Conference_Titel :
Lasers and Electro-Optics Society, 2002. LEOS 2002. The 15th Annual Meeting of the IEEE
Print_ISBN :
0-7803-7500-9
DOI :
10.1109/LEOS.2002.1133927