DocumentCode
3861066
Title
Efficient self-recovering ASIC design
Author
S.N. Hamilton;A. Orailoglu
Author_Institution
California Univ., San Diego, La Jolla, CA, USA
Volume
15
Issue
4
fYear
1998
Firstpage
25
Lastpage
35
Abstract
The authors present a framework for tailoring fault-tolerant approaches for both permanent and transient faults to the specific needs of an application. These methodologies provide an efficient alternative to traditional triplication and rollback schemes and allow tailoring of area-resiliency trade-offs for individual designs.
Keywords
"Application specific integrated circuits","Degradation","Fault tolerance","Fault diagnosis","Application software","Delay","Fault detection","Testing","Computer errors","High level synthesis"
Journal_Title
IEEE Design & Test of Computers
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.735924
Filename
735924
Link To Document