• DocumentCode
    3861066
  • Title

    Efficient self-recovering ASIC design

  • Author

    S.N. Hamilton;A. Orailoglu

  • Author_Institution
    California Univ., San Diego, La Jolla, CA, USA
  • Volume
    15
  • Issue
    4
  • fYear
    1998
  • Firstpage
    25
  • Lastpage
    35
  • Abstract
    The authors present a framework for tailoring fault-tolerant approaches for both permanent and transient faults to the specific needs of an application. These methodologies provide an efficient alternative to traditional triplication and rollback schemes and allow tailoring of area-resiliency trade-offs for individual designs.
  • Keywords
    "Application specific integrated circuits","Degradation","Fault tolerance","Fault diagnosis","Application software","Delay","Fault detection","Testing","Computer errors","High level synthesis"
  • Journal_Title
    IEEE Design & Test of Computers
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.735924
  • Filename
    735924