DocumentCode
3861425
Title
Test Data Generation for Multiple Paths Based on Local Evolution
Author
Xiangjuan Yao;Dunwei Gong;Wenliang Wang
Author_Institution
China University of Mining and Technology, China
Volume
24
Issue
1
fYear
2015
Firstpage
46
Lastpage
51
Abstract
Generating test data by genetic algorithms is a promising research direction in software testing, among which path coverage is an important test method. The efficiency of test data generation for multi-path coverage needs to be further improved. We propose a test data generation method for multi-path coverage based on a genetic algorithm with local evolution. The mathematical model is established for all target paths, while in the algorithm the individuals are evolved locally according to different objective functions. We can improve the utilization efficiency of test data. The computation cost can be reduced by using fitness functions of different granularity in different phases of the algorithm.
Journal_Title
Chinese Journal of Electronics
Publisher
iet
ISSN
1022-4653
Type
jour
DOI
10.1049/cje.2015.01.008
Filename
7510470
Link To Document