• DocumentCode
    3861491
  • Title

    19 GHz vertical Si p-channel MOSFET

  • Author

    J. Moers;D. Klaes;A. Tonnesmann;L. Vescan;S. Wickenhauser;M. Marso;P. Kordos;H. Luth

  • Author_Institution
    Inst. fur Schicht- und Ionentech., Forschungszentrum Julich GmbH, Germany
  • Volume
    35
  • Issue
    3
  • fYear
    1999
  • Firstpage
    239
  • Lastpage
    240
  • Abstract
    Vertical Si p-MOSFETs with channel lengths of 100 nm were fabricated using selective low pressure chemical vapour deposition (LPCVD) epitaxial growth and conventional i-line lithography. The layout, called VOXFET, reduces gate to source/drain overlap capacitances, thus improving high speed applications. Transistors with a gate width of 12 /spl mu/m and gate oxide thickness of 10 nm show transconductances g/sub m/ of 200 mS/mm and measured cutoff frequencies of f/sub T/=8.7 GHz and f/sub MAX/=19.2 GHz.
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19990138
  • Filename
    755943