• DocumentCode
    3861868
  • Title

    Comparative study of theoretical Kerr electro-optic fringe patterns in 2-D and axisymmetric electrode geometries

  • Author

    A. Ustundag;M. Zahn

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
  • Volume
    8
  • Issue
    1
  • fYear
    2001
  • Firstpage
    15
  • Lastpage
    25
  • Abstract
    Kerr electro-optic fringe patterns have long been used to study space charge injection and transport phenomena in highly birefringent materials such as nitrobenzene, Most past experimental work has been limited to 1 or 2-dimensional geometries where the electric field magnitude and direction have been constant along the light path such as two concentric or parallel cylinders or parallel plate electrodes. For these geometries the extrema in the fringe patterns can be used directly to find the electric field magnitude and direction. In this work we extend the fringe based Kerr electro-optic measurement technique to a point/plane electrode geometry which often is used in HV research to create large electric fields for charge injection at known location and at reasonable voltages. We calculate theoretical Kerr electro-optic fringe patterns for this point/plane electrode geometry with and without space charge distributions, for which the electric field magnitude and direction vary along the light path. We particularly compare the calculated space charge free optical patterns for the point/plane electrodes to the optical patterns of the 2-dimensional analog blade/plane geometry. We underline the differences and study how these fringe patterns can be used to reconstruct the axisymmetric electric field components in practice.
  • Keywords
    "Space charge","Dielectric liquids","Electrodes","Nonlinear optics","Optical polarization","Dielectric measurements","Electric variables measurement","Geometry","Birefringence","Current measurement"
  • Journal_Title
    IEEE Transactions on Dielectrics and Electrical Insulation
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.910422
  • Filename
    910422