• DocumentCode
    3862878
  • Title

    Excellent photonic-assisted measurement system for high order mode pattern scan in reactive near field

  • Author

    Ingeun Lee;Mun Seok Choe;Dong-Joon Lee;EunMi Choi

  • Author_Institution
    Department of Electrical Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan 689-798, Republic of Korea
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We present experimental results of TE6,2 mode electric field pattern results utilizing a photonic-assisted W-band measurement system and a vector network analyzer (VNA) system in the reactive near field region. We introduce the photonic-assisted W-band measurement system and demonstrate that it provides extremely precise probing capability compared to the VNA system, especially when a higher order mode pattern is scanned in the extreme near field region.
  • Keywords
    "Photonics","Probes","Electrooptical waveguides","Electric fields","Distortion measurement","Apertures","Yttrium"
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2015 40th International Conference on
  • ISSN
    2162-2027
  • Electronic_ISBN
    2162-2035
  • Type

    conf

  • DOI
    10.1109/IRMMW-THz.2015.7327658
  • Filename
    7327658
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3862878