• DocumentCode
    3865
  • Title

    Evaluation of the Performance of Distributed Temperature Measurements With Single-Mode Fiber Using Rayleigh Backscatter up to 1000 ^{\\circ}{\\rm C}

  • Author

    Wood, T.W. ; Blake, Brian ; Blue, Thomas E. ; Petrie, Christian Matthew ; Hawn, David

  • Author_Institution
    Dept. of Nucl. Eng., Ohio State Univ., Columbus, OH, USA
  • Volume
    14
  • Issue
    1
  • fYear
    2014
  • fDate
    Jan. 2014
  • Firstpage
    124
  • Lastpage
    128
  • Abstract
    In this paper, inexpensive single-mode silica optical fibers were interrogated with Luna Innovations´ optical backscatter reflectometer to perform distributed temperature measurements at temperatures up to 1000 °C. Measurements of the Rayleigh backscattered signal were taken continuously to determine the amount of light that is backscattered as a function of temperature and position along the length of the fiber. These data were post-processed to determine the spectral shift in the Rayleigh backscatter signature. The spectral shift data were then calibrated to a change in temperature. This paper determines an upper operational temperature limit of 650 °C for the distributed measurement technique based on Rayleigh backscatter using Corning´s SMF-28e+ commercially available single-mode fiber.
  • Keywords
    Rayleigh scattering; distributed sensors; fibre optic sensors; performance evaluation; reflectometers; spectral line shift; spectral methods of temperature measurement; temperature sensors; Rayleigh backscatter signature; Rayleigh backscattered signal; distributed temperature measurement; optical backscatter reflectometer; single mode fiber; single mode silica optical fiber; spectral shift; temperature 650 C; Backscatter; Coatings; Furnaces; Optical fiber sensors; Optical fibers; Temperature measurement; Temperature sensors; Optical fiber; Rayleigh scatter; optical frequency domain reflectormetry (OFDR); temperature sensing;
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2013.2280797
  • Filename
    6595113